Cees Dekker Lab

Staff - Non Union Job Category M&P - AAPS Job Title Research Scientist: X-ray photoelectron spectroscopy Department Research | B. Britton| Department of Materials Engineering | Faculty of Applied Science (Ben Britton) Posting End Date August 10, 2026 Note: Applications will be accepted until 11:59 PM on the Posting End Date. Job End Date August 31, 2029 At UBC, we believe that attracting and sustaining a diverse workforce is key to the successful pursuit of excellence in research, innovation, and learning for all faculty, staff and students. Our commitment to employment equity helps achieve inclusion and fairness, brings rich diversity to UBC as a workplace, and creates the necessary conditions for a rewarding career. Job Summary The pay range for this position is between $6,438.50 and $9,255.58 CAD monthly. The Electron Microscopy Laboratory, hosted in the Department of Materials Engineering within the Faculty of Applied Science, is a core advanced characterization facility supporting researchers across UBC, Canadian academic institutions, and industrial partners. As part of the Characterization @ UBC research excellence cluster, the Laboratory provides access to specialized microscopy, spectroscopy, and sample preparation capabilities that enable high-quality analysis of materials across areas such as energy, aerospace, advanced manufacturing, and materials for net zero. The Research Scientist will support the Laboratory’s expanding surface and near-surface characterization activities, with primary responsibility for the operation and application of the Thermo Fisher Scientific Nexsa G2 X-ray Photoelectron Spectrometer. The role will contribute to experimental design, analytical method development, instrument operation and maintenance, user training, data analysis, and collaborative project delivery. Working independently within defined project objectives and in consultation with Laboratory leadership, the incumbent will help academic and industry users develop appropriate characterization approaches, interpret results, and integrate XPS with related microscopy and microanalysis workflows. Organizational Status The Research Scientist reports to Dr. Ben Britton and works as part of the Electron Microscopy Laboratory team within the Department of Materials Engineering. The role works collaboratively with faculty members, research staff, technicians, students, visiting researchers, external academic users, industry partners, and members of the Characterization @ UBC research cluster. Work Performed Designs and implements experimental and analytical approaches for XPS-based surface and near-surface characterization. Develops protocols, specifications, and workflows to meet project requirements, including sample preparation, data acquisition, spectral interpretation, elemental quantification, and chemical state analysis. Manages the day-to-day operation of the Thermo Fisher Scientific Nexsa G2 X-ray Photoelectron Spectrometer and associated analytical and sample preparation equipment. Maintains, tunes, calibrates, and troubleshoots equipment to support reliable operation, and works with suppliers and service providers. Management of consumables, service needs, operating procedures, and training documentation for the Laboratory. Analyzes and interprets XPS data and contributes to the preparation of technical reports, presentations, publications, and project summaries for academic and industry users. Communicates results, assumptions, limitations, and uncertainty clearly to support sound scientific interpretation and decision-making. Development and application of correlative characterization workflows that may include XPS, optical microscopy, SEM, TEM, FIB, and related sample preparation or analytical methods. Development of new protocols, software-supported workflows, or equipment implementation strategies where appropriate. Develops and delivers training for safe and effective operation of the XPS system and related equipment. Provides technical guidance to students, research staff, faculty members, visiting researchers, and external users on experimental design, analytical procedures, equipment use, data quality, and safety requirements. Works with academic and industry partners to understand project objectives, define scope, plan experimental work, analyze results, and meet agreed deliverables. Manages multiple projects simultaneously and contributes to budget estimates, quotations, timelines, and client communications for facility-based work. Contributes to the development of new research ideas, grant applications, outreach materials, and client engagement activities related to XPS and advanced materials characterization. May participate in progress meetings, technical presentations, conferences, or publications aligned with the Laboratory’s research and service activities. Other related duties Consequence of Error / Judgment The Research Scientist exercises independent professional and technical judgment in the design, execution, analysis, and interpretation of XPS experiments. Errors in experimental design, instrument setup, spectral interpretation, elemental quantification, or chemical state assignment may result in inaccurate or misleading results for academic and industry partners. Poor judgment in data interpretation, failure to identify artefacts, or inadequate communication of uncertainty and limitations may compromise project outcomes, affect research conclusions, delay deliverables, or damage the reputation of the Laboratory. Errors in instrument operation, calibration, maintenance, sample handling, or safety procedures may result in equipment damage, costly downtime, loss of fee-for-service revenue, disruption to the user community, or safety risks. Supervision Received The Research Scientist works independently within defined project objectives, Laboratory procedures, safety requirements, and facility priorities. Technical guidance and direction are available from Dr. Ben Britton and other Laboratory leadership as required. The incumbent is expected to exercise independent judgment in planning and completing assigned work, while consulting with Laboratory leadership on complex scientific, operational, financial, or strategic matters. Supervision Given The role does not have formal ongoing management responsibility for staff, but provides technical guidance, training, work direction, and functional supervision to students, research trainees, visiting researchers, facility users, and technical personnel involved in XPS-related activities. Minimum Qualifications Undergraduate degree in Engineering or Applied Science. Minimum of one year of related experience, or the equivalent combination of education and experience. Willingness to respect diverse perspectives, including perspectives in conflict with one’s own. Demonstrates a commitment to enhancing one’s own awareness, knowledge, and skills related to equity, diversity, and inclusion. Preferred Qualifications PhD in a field relevant to materials characterization, such as materials science and engineering, physics, applied physics, chemical engineering, chemistry, or a related discipline. Advanced training and demonstrated experience in X-ray photoelectron spectroscopy, including XPS instrument operation, optimization, data analysis, spectral interpretation, and application to materials characterization. Experience working in or supporting an advanced analytical research facility, such as an X-ray, electron microscopy, spectroscopy, or related materials characterization facility, is preferred. Experience designing and delivering research or technical projects, including experimental planning, data interpretation, reporting, and communication with academic or industry partners, is preferred. Experience training, mentoring, or providing technical guidance to students, staff, researchers, or facility users is preferred. Strong interpersonal, communication, organizational, and collaborative skills in a multidisciplinary research environment are preferred. Additional preferred experience may include data analysis workflows using Python or MATLAB, in situ or in operando methods, multimodal or multiscale characterization, electron microscopy, or focused ion beam sample preparation. UBC - One of the World's Leading Universities As one of the world's leading universities, the University of British Columbia creates an exceptional learning environment that fosters global citizenship, advances a civil and sustainable society, and supports outstanding research to serve the people of British Columbia, Canada and the world. UBC hires on the basis of merit and is committed to employment equity. All qualified persons are encouraged to apply. Equity and diversity are essential to academic excellence. An open and diverse community fosters the inclusion of voices that have been underrepresented or discouraged. We encourage applications from members of groups that have been marginalized on any grounds enumerated under the B.C. Human Rights Code, including sex, sexual orientation, gender identity or expression, racialization, disability, political belief, religion, marital or family status, age, and/or status as a First Nation, Metis, Inuit, and/or Indigenous person. All qualified candidates are encouraged to apply; however Canadians and permanent residents will be given priority. If you have any accommodation or accessibility needs during the job application process, please contact the Centre for Workplace Accessibility at workplace.accessibility@ubc.ca.

This paper presents an improved technique to collect images using single-pixel detectors. The method is especially suited for images that are to be processed by convolution operators. Ghost imaging (GI) is a generalized imaging approach, whereby instead of using a pixelated camera, one modulates the illumination patterns in a known way and acquires images using a single-pixel sensor. This can be advantageous when cameras are impractical or not available. Relatedly, in computer vision, convolution operators are commonly applied to images for tasks such as edge detection, denoising, etc. This paper shows that by structuring the GI illumination patterns as a Toeplitz matrix, one can greatly improve the quality of such convolution-processed images, while reducing the number of patterns required, compared to existing methods. This approach is well suited for X-ray imaging, where Toeplitz-matrix illumination is readily produced by shifting a single random pattern across the field of view. This novel "Toeplitz GI" has the potential to significantly reduce the acquisition time and efficiency of X-ray GI for many tasks relevant to computer vision.

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